碳化硅半导体材料中点缺陷的最优化设计
序号 | 标题 | 类型 | 作者 |
---|---|---|---|
1 | Origin of Ga vacancy-related YL center in n-type GaN: A first-principles study | 期刊论文 | Qian-Ji Wang;Hai-Shan Zhang;Lin Shi;Jian Gong |
2 | Theoretical Simulation and Experimental Verification of the Competition between Different Recombination Channels in GaN Semiconductor | 期刊论文 | Hai-Shan Zhang;Lin Shi;Zhenghui Liu;Gengzhao Xu;Wentao Song;ya-kun wang;zhong-jie xu;Xiaobao Yang;Yujun Zhao;Xuelin Yang;Bo Shen;Lin-Wang Wang;Ke Xu |
3 | Antisite Defect SiC as a Source of the DI Center in 4H-SiC | 期刊论文 | Hai-Shan Zhang;Jian Gong;Lin Shi |