电应力下沟槽型SiC-MOSFET退化机理及表征模型研究

62004037
2020
F0404.半导体电子器件与集成
魏家行
青年科学基金项目
副研究员
东南大学
24万元
表征模型;退化机理;碳化硅金属氧化物半导体场效应晶体管;电应力;沟槽型
2021-01-01到2023-12-31
  • 中英文摘要
  • 结题摘要
  • 结题报告
  • 项目成果
  • 项目参与人
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序号 标题 类型 作者
1 Degradation Investigations on Asymmetric Trench SiC Power MOSFETs Under Repetitive Unclamped Inductive Switching Stress 会议论文 Hao Fu;Jiaxing Wei;Xiaowen Yan;Hangbo Zhao;Zhaoxiang Wei;Hua Zhou;Weifeng Sun;Siyang Liu
2 A Split-Gate Power MOSFET Obtaining Ultra-Wide SOA Based on Time-Shared and Partitioned Conduction Gate Control 期刊论文 Tuanzhuang Wu;Jiaxing Wei;Xin Tong;Tianyi He;Sheng Li;Long Zhang;Siyang Liu;Desheng Ding;Weifeng Sun
3 一种混合石墨烯电极的半导体器件及其制造方法 专利 魏家行;徐航;隗兆祥;付浩;薛璐洁;王恒德;刘斯扬;孙伟锋;时龙兴
4 一种低导通电阻的功率器件及制造方法 专利 魏家行;王晨露;付浩;宋兆旭;刘斯扬;孙伟锋;时龙兴
5 Unclamped-Inductive-Switching Behaviors of p-GaN HEMTs at Cryogenic Temperature 期刊论文 Chi Zhang;Sheng Li;Weihao Lu;Siyang Liu;Yanfeng Ma;Jingwen Huang;Jiaxing Wei;Long Zhang;Weifeng Sun
6 一种隧穿功率器件及其制造方法 专利 魏家行;朱旭东;付浩;隗兆祥;刘斯扬;孙伟锋;时龙兴
7 Influence of Different Device Structures on the Degradation for Trench-Gate SiC MOSFETs: Taking Avalanche Stress as an Example 期刊论文 Zhaoxiang Wei;Hao Fu;Xiaowen Yan;Sheng Li;Long Zhang;Jiaxing Wei;Siyang Liu;Weifeng Sun;Weili Wu;Song Bai
8 低回滞电压的逆导型绝缘栅双极型晶体管及其制备工艺 专利 刘斯扬;李仁伟;吴团庄;魏家行;孙伟锋;时龙兴
9 一种具有低续流损耗的功率半导体器件及其制造方法 专利 刘斯扬;孙佳萌;隗兆祥;魏家行;孙伟锋;时龙兴
10 先进智能功率全集成工艺关键技术与应用 奖励 林峰;李春旭;吴汪然;陈淑娴;魏家行;金宏峰;金华俊;刘新新;马春霞
11 一种低隧穿泄漏电流的功率器件及其制造方法 专利 孙伟锋;曹钧厚;付浩;魏家行;刘斯扬;时龙兴
12 Surge Current Failure Mechanism of 650V Double-Trench SiC MOSFETs 会议论文 Junhou Cao;Jiaxing Wei;Zhaoxiang Wei;Hangbo Zhao;Hao Fu;Siyang Liu;Weifeng Sun
13 Investigations on Unclamped-Inductive-Switching Behaviors of p-GaN HEMTs at Cryogenic Temperature 会议论文 Chi Zhang;Weihao Lu;Sheng Li;Siyang Liu;Yanfeng Ma;Jingwen Huang;Long Zhang;Jiaxing Wei;Weifeng Sun
14 Quasisaturation Effect and Optimization for 4H-SiC Trench MOSFET With P+ Shielding Region 期刊论文 Hao Fu;Jiaxing Wei;Zhaoxiang Wei;Siyang Liu;Lihua Ni;Zhuo Yang;Weifeng Sun
15 Theory and Design of Novel Power Poly-Si/SiC Heterojunction Tunneling Transistor Structure 期刊论文 Hao Fu;Jiaxing Wei;Zhaoxiang Wei;Sheng Li;Long Zhang;Song Bai;Runhua Huang;Xiaolei Yang;Siyang Liu;Weifeng Sun
16 基于异质结的高功率密度隧穿半导体器件及其制造工艺 专利 魏家行;付浩;王恒德;隗兆祥;刘斯扬;孙伟锋;时龙兴
17 Single Pulse Short-Circuit Failure Mechanism of 1200V Asymmetric Trench SiC MOSFETs 会议论文 Zhaoxiang Wei;Jiaxing Wei;Xiaowen Yan;Hua Zhou;Hao Fu;Siyang Liu;Weifeng Sun
18 Review on the Reliability Mechanisms of SiC Power MOSFETs: A Comparison Between Planar-Gate and Trench-Gate Structures 期刊论文 Jiaxing Wei;Zhaoxiang Wei;Hao Fu;Junhou Cao;Tuanzhuang Wu;Jiameng Sun;Xudong Zhu;Sheng Li;Long Zhang;Siyang Liu;Weifeng Sun
19 1200V 4H-SiC trench MOSFET with superior figure of merit and suppressed quasi-saturation effect 期刊论文 Hao Fu;Zhaoxiang Wei;Siyang Liu;Jiaxing Wei;Hang Xu;Lihua Ni;Zhuo Yang;Weifeng Sun
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