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何刚
面上项目
项目编号:
51572002 【年份:2015】
项目名称:
高k栅介质/钝化层/InGaAs叠层结构设计、界面失稳调控及性能优化
资助金额:
64万
单位名称:
安徽大学
学科分类:
E0207.无机非金属半导体与信息功能材料
参与者:
安徽大学
高k栅介质/钝化层/InGaAs叠层结构设计、界面失稳调控及性能优化
项目批准号:
51572002
批准年份:
2015
学科分类:
E0207.无机非金属半导体与信息功能材料
项目负责人:
何刚
资助类别:
面上项目
负责人职称:
教授
依托单位:
安徽大学
资助金额:
64万元
关键词:
III-V族半导体;场效应晶体管;载流子迁移率;界面特性;高介电常数介质
起止时间:
2016-01-01到2019-12-31
中英文摘要
结题摘要
结题报告
项目成果
项目参与人
查看更多信息请先登录或注册
查看更多信息请先登录或注册
查看更多信息请先登录或注册
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期刊论文
会议论文
著作
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1
Modulation of electrical properties and current conduction mechanism of HfAlO/Ge gate stack by ALD-derived Al2O3 passivation layer
期刊论文
He Gang;Li Wendong;Wei Hehe;Jiang Shanshan;Xiao DongQI;Jin Peng;Gao Juan
2
Interfacial modulation and electrical properties improvement of solution-processed ZrO2 gate dielectrics upon Gd incorporation
期刊论文
Xiao Dongqi;He Gang;Lv Jianguo;Wang Peihong;Liu Mao;Gao Juan;Jin Peng;Jiang Shanshan;Li Wendong;Sun Zhaoqi
3
Microstructure, wettability, optical and electrical properties of HfO2 thin films: Effect of oxygen partial pressure
期刊论文
Gao J.;He G.;Deng B.;Xiao D. Q.;Liu M.;Jin P.;Zheng C. Y.;Sun Z. Q.
4
Oxygen partial pressure ratio modulated electrical performance of amorphous InGaZnO thin film transistor and inverter Y.C.
期刊论文
Zhang Yongchun;He Gang;Zhang Chong;Zhu Li;Yang Bing;Lin Qibing;Jiang xishun
5
Passivation of Ge surface treated with trimethylaluminum and investigation of electrical properties of HfTiO/Ge gate stacks
期刊论文
Gao Juan;He Gang;Xiao Dongqi;Jin Peng;Jiang Shanshan;Li Wendong;Liang Shuang;Zhu Li
6
Microstructure, optical, electrical properties, and leakage current transport mechanism of sol-gel-processed high-k HfO2 gate dielectrics
期刊论文
Jin Peng;He Gang;Xiao Dongqi;Gao Juan;Liu Mao;Lv Jianguo;Liu Yanmei;Zhang Miao;Wang Peihong;Sun Zhaoqi
7
Microstructure, optical and electrical properties of sputtered HfFiO high-k gate dielectric thin films
期刊论文
Jiang S. S.;He G.;Gao J.;Xiao D. Q.;Jin P.;Li W. D.;Lv J. G.;Liu M.;Liu Y. M.;Sun Z. Q.
8
Modulation of interfacial and electrical properties of ALD-derived HfAlO/Al2O3/Si gate stack by annealing temperature
期刊论文
Gao J;He G;Liu M;Lv J G;Sun Z Q;Zheng C Y;Jin P;Xiao D Q;Chen X S
9
Interface quality modulation, band alignment modification and optimization of electrical properties of HfGdO/Ge gate stacks by nitrogen incorporation
期刊论文
Gao Juan;He Gang;Fang Zebo;Lv Jianguo;Liu Mao;Sun Zhaoqi
10
Baking-temperature-modulated optical and electrical properties of HfTiOx gate dielectrics via sol-gel method
期刊论文
Jin P.;He G.;Wang P. H.;Liu M.;Xiao D. Q.;Gao J.;Chen H. S.;Chen X. S.;Sun Z. Q.;Zhang M.;Lv J. G.;Liu Y. M.
11
Eco-Friendly Fully Water-Driven Metal–Oxide Thin Films and Their Applications in Transistors and Logic Circuits
期刊论文
Zhang Chong;He Gang;Yang Bing;Xia Yufeng;Zhang Yongchun
12
Modification of optical and electrical properties of sol-gel-derived TiO2-doped ZrO2 gate dielectrics by annealing temperature
期刊论文
Xiao D. Q.;He G.;Liu M.;Gao J.;Jin P.;Jiang S. S.;Li W. D.;Zhang M.;Liu Y. M.;Lv J. G.;Sun Z. Q.
13
Nitrogen-concentration modulated interfacial and electrical properties of sputtering-derived HfGdON gate dielectric
期刊论文
Ma Rui;Liu Mao;He Gang;Fang Ming;Shang Guoliang;Fei Guangtao;Zhang Lide
14
Modulation of interfacial and electrical properties of HfGdO/GaAs gate stacks by ammonium sulfide passivation and rapid thermal annealing
期刊论文
Jiang Shanshan;He Gang;Liang Shuang;Zhu Li;Li Wendong;Zheng Changyong;Lv Jianguo;Liu Mao
15
Fully solution-induced high performance indium oxide thin film transistors with ZrOx high-k gate dielectrics
期刊论文
L. Zhu;G. He;J. G. Lv;E. Fortunato;R. Martins
16
Annealing temperature-dependent microstructure and optical and electrical properties of solution-derived Gd-doped ZrO2 high-k gate dielectrics
期刊论文
Zhu Li;He Gang;Sun Zhaoqi;Liu Mao;Jiang Shanshan;Liang Shuang;Li Wendong
17
Modification of electrical properties and carrier transportation mechanism of ALD-derived HfO2/Si gate stacks by Al2O3 incorporation
期刊论文
Gao Juan;He Gang;Sun Zhaoqi;Chen Hanshuang;Zheng Changyong;Jin Peng;Xiao Dongqi;Liu Mao
18
Annealing-induced evolution in interface stability and electrical performance of sputtering-driven rare-earth-based gate oxides
期刊论文
Wang Die;He Gang;Liang Shuang;Liu Mao
19
Annealing-temperature-modulated optical, electrical properties, and leakage current transport mechanism of sol–gel-processed high-k HfAlOx gate dielectrics
期刊论文
Jin Peng;He Gang;Fang Zebo;Liu Mao;Xiao Dongqi;Gao Juan;Jiang Shanshan;Li wendong;Sun Zhaoqi
20
Modulation of Band Offset in Sputtering-Derived MoS2/HfO2 Heterojunction by Gd Incorporation
期刊论文
Li Wendong;He Gang;Zheng Changyong;Xiao Dongqi;Jin Peng;Jiang Shanshan;Gao Juan;Lv Jianguo
21
Modification of band alignments and optimization of electrical properties of InGaZnO MOS capacitors with high-k HfOxNy gate dielectrics
期刊论文
Zheng C. Y.;He G.;Chen X. F.;Liu M.;Lv J. G.;Gao J.;Zhang J. W.;Xiao D. Q.;Jin P.;Jiang S. S.;Li W. D.;Sun Z. Q.
22
Modulation of the interfacial and electrical properties of atomic-layer-deposited Hf0.5Al0.5O/Si gate stacks using Al2O3 passivation layer with various thickness
期刊论文
Gao Jaun;He Gang;Wang Die;Liang Shuang
23
Comparative study on in situ surface cleaning effect of intrinsic oxide-covering GaAs surface using TMA precursor and Al2O3 buffer layer for HfGdO gate dielectrics
期刊论文
J. Gao;G. He;S. Liang;D. Wang;B. Yang
24
Atomic-layer-deposited (ALD) Al2O3 passivation dependent interface chemistry, band alignment and electrical properties of HfYO/Si gate stacks
期刊论文
Liang Shuang;He Gang;Wang Die;Qiao Fen
25
Modulating the Interface Chemistry and Electrical Properties of Sputtering-Driven HfYO/GaAs Gate Stacks by ALD Pulse Cycles and Thermal Treatment
期刊论文
Liang Shuang;He Gang;Wang Die;Hao Lin;Zhang Miao;Cui Jingbiao
26
Annealing Temperature Dependent Electrical Properties and Leakage Current Transport Mechanisms in Atomic Layer Deposition-Derived Al2O3-Incorporated HfO2/Si Gate Stack
期刊论文
Gao Juan;He Gang;Zhang Jiwen;Chen Xuefei;Jin Peng;Xiao Dongqi;Liu Mao;Ma Rui;Sun Zhaoqi
27
Analysis of the electrical properties and current transportation mechanism of a metal oxide semiconductor (MOS) capacitor based on HfGdO gate dielectrics
期刊论文
Jiang Shanshan;He Gang;Fang Zebo;Wang Peihong;Liu Yanmei;Lv Jianguo;Liu Mao
28
Low-Voltage-Operating Transistors and Logic Circuits Based on a Water-Driven ZrGdOx Dielectric with Low-Cost ZnSnO
期刊论文
Yang Bing;He Gang;Zhu Li;Zhang Chong;Zhang Yongchun;Xia Yufeng;Fakhari Alam;Sun Zhaoqi
29
Interface Modulation and Optimization of Electrical Properties of HfGdO/GaAs Gate Stacks by ALD-Derived Al2O3 Passivation Layer and Forming Gas Annealing
期刊论文
S. S. Jiang;G. He;M. Liu;L. Zhu;S. Liang;W. D. Li;Z. Q. Sun;M. L. Tian
30
Potential solution-induced HfAlO dielectrics and their applications in low-voltage-operating transistors and high-gain inverters
期刊论文
He Gang;Li Wendong;Sun Zhaoqi;Zhang Miao;Chen Xiaoshuang
31
Nitrogen-concentration modulated interface quality, band alignment and electrical properties of HfTiON/Ge gate stack pretreated by trimethylaluminum precursor
期刊论文
Gao Juan;He Gang;Xiao Dongqi;Jiang Shanshan;Lv Jianguo;ChenG Chao;Sun Zhaoqi
32
Evolution of interface chemistry and dielectric properties of HfO2/Ge gate stack modulated by Gd incorporation and thermal annealing
期刊论文
He Gang;Zhang Jiwen;Sun Zhaoqi;Lv Jianguo;Chen Hanshuang;Liu Mao
33
Eco-Friendly, Water-Induced In(2)O(3 )Thin Films for High-Performance Thin-Film Transistors and Inverters
期刊论文
L. Zhu;G. He;Y. T. Long;B. Yang;J. G. Lv
34
Nontoxic, Eco-friendly Fully Water-Induced Ternary Zr-Gd-O Dielectric for High-Performance Transistors and Unipolar Inverters
期刊论文
L. Zhu;G. He;W. D. Li;B. Yang;E. Fortunato;R. Martins
35
Interface chemistry and leakage current mechanism of HfGdON/Ge gate stack modulated by ALD-driven interlayer
期刊论文
He Gang;Wang Die;Ma Rui;Liu Mao;Cui Jingbiao
36
Solution-Processed DyOx for Aging Diffusion ZnSnO Transistors and Applications in Low-Voltage-Operating Logic Circuits
期刊论文
Yang Bing;He Gang;Zhang Yongchun;Zhang Chong;Xia Yufeng;Alam Fakhari;Cui Jingbiao
37
Water-Derived All-Oxide Thin-Film Transistors With ZrAlOx Gate Dielectrics and Exploration in Digital Circuits
期刊论文
Zhu Li;He Gang;Zhang Chong;Yang Bing;Xia Yufeng;Fakhari Alam;Zhang Yongchun
38
Comparative passivation effect of ALD-driven HfO2 and Al2O3 buffer layers on the interface chemistry and electrical characteristics of Dy-based gate dielectrics
期刊论文
D. Wang;G. He;L. Hao;J. Gao;M. Zhang
39
Interface chemistry and electronic structure of ALD-derived HfAlO/Ge gate stacks revealed by X-ray photoelectron spectroscopy
期刊论文
He Gang;Jiang shanshan;Li Wendong;Zheng Changyong;He Huaxin;Li Jing;Sun Zhaoqi;Liu Yanmei;Liu Mao
40
Modulation of the microstructure, optical, and electrical properties of HfYO gate dielectrics by annealing temperature
期刊论文
Liang Shuang;He Gang;Zhu Li;Zheng Changyong;Gao Juan;Wang Die;Zhang Chong;Liu Mao
41
Solution-processed HfGdO gate dielectric thin films for CMOS application: Effect of annealing temperature
期刊论文
Li Wendong;He Gang;Zheng Changyong;Liang Shuang;Zhu Li;Jiang Shanshan
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