定量外差锁相成像技术的半导体载流子寿命成像

61601092
2016
F0114.探测与成像
孙启明
青年科学基金项目
讲师
电子科技大学
21万元
高频外差锁相成像;载流子寿命;近红外成像;光载流子辐射测量;无损检测
2017-01-01到2019-12-31
  • 中英文摘要
  • 结题摘要
  • 结题报告
  • 项目成果
  • 项目参与人
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序号 标题 类型 作者
1 Surface recombination velocity imaging of wet-cleaned silicon wafers using quantitative heterodyne lock-in carrierography 期刊论文 Qiming Sun;Alexander Melnikov;Andreas Mandelis;Robert H. Pagliaro
2 Simultaneous determination of effective carrier lifetime and resistivity of Si wafers using the nonlinear nature of photocarrier radiometric signals 期刊论文 Qiming Sun;Alexander Melnikov;Jing Wang;Andreas Mandelis
3 Influence of Nonlinearity on Electronic Transport Characterization of Ion‑Implanted Silicon Wafers with Photocarrier Radiometry 期刊论文 Xiaoke Lei;Bincheng Li;Qiming Sun;Jing Wang;Chunming Gao
4 Temperature- and Size-Dependent Exciton Dynamics in PbS Colloidal Quantum Dot Thin Films Using Combined Photoluminescence Spectroscopy and Photocarrier Radiometry 期刊论文 Jing Wang;Andreas Mandelis;Qiming Sun;Bincheng Li;Chunming Gao
5 一种非接触式测量硅晶圆电阻率的光学方法 专利 孙启明;王静;高椿明;雷晓轲
6 Nonlinear two-layer model for photocarrier radiometry of ion-implanted silicon wafers 期刊论文 Xiaoke Lei;Bincheng Li;Qiming Sun;Jing Wang;Chunming Gao
7 Electronic transport characterization of B+ ion-implanted silicon wafers with nonlinear photocarrier radiometry 期刊论文 Xiaoke Lei;Bincheng Li;Qiming Sun;Jing Wang;Chunming Gao
8 Surface recombination velocity imaging of HF-etched Si wafers using dynamic heterodyne lock-in carrierography 期刊论文 Qiming Sun;Alexander Melnikov;Andreas Mandelis;Robert H. Pagliaro
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