基于二维纳米材料的半导体器件模拟方法研究
序号 | 标题 | 类型 | 作者 |
---|---|---|---|
1 | Phonon-Limited Electron Mobility in Single-Layer MoS2 | 期刊论文 | ZENG Lang|XIN Zheng|CHEN Shaowen|DU Gang|LIU Xiaoyan| |
2 | Remote phonon and impurity screening effect of substrate and gate dielectric on electron dynamics in single layer MoS2 | 期刊论文 | Zeng, Lang|Xin, Zheng|Chen, Shaowen|Du, Gang|Kang, Jinfeng|Liu, Xiaoyan| |
3 | Strain Effect on Electronic Properties Tuning of Bilayer WS2 | 会议论文 | Zheng Xin|Lang Zeng|Kangliang Wei|Gang Du|Jinfeng Kang|Xiaoyan Liu| |
4 | Strain Affected Electronic Propertiesof Bilayer Tungsten Disulfide (WS2) | 期刊论文 | Zheng Xin|Lang Zeng|Yijiao Wang|Kangliang Wei|Gang Du|Xiaoyan Liu| |
5 | The Electronic Properties of Ultra-narrow Armchair MoS2 Nanoribbon | 会议论文 | Zheng Xin|Lang Zeng|Kangliang Wei|Gang Du|Jinfeng Kang|Xiaoyan Liu| |