基于步降加速退化试验的贮存寿命高效预测方法研究
序号 | 标题 | 类型 | 作者 |
---|---|---|---|
1 | Accelerated reliability demonstration under competing failure modes | 期刊论文 | Wei Luo|Chun-hua Zhang|Xun Chen|Yuan-yuan Tan| |
2 | Accelerated Reliability Demonstration for Weibull Distribution with a Nonconstant Shape Parameter | 会议论文 | |
3 | 加速寿命试验技术与应用 | 专著 | |
4 | Statistical analysis of step-down stress accelerated life testing | 会议论文 | |
5 | System reliability demonstration with equivalent data from component accelerated testing based on reliability target transformation | 期刊论文 | Wei Luo|Chunhua Zhang|Xun Chen|Yashun Wang| |
6 | Statistical analysis of accelerated degradation testing for old products with initial working time | 期刊论文 | Yuanyuan Tan|Chunhua Zhang|Xun Chen|Yashun Wang| |
7 | 三参数Weibull分布竞争失效场合变应力加速寿命试验统计分析 | 期刊论文 | 张详坡|尚建忠|陈循|张春华| |
8 | Accelerated Degradation Demonstration Test Method Based On Gamma Process Models | 会议论文 |