爆炸药间隙零门的功能可靠性研究
序号 | 标题 | 类型 | 作者 |
---|---|---|---|
1 | 性能退化数据下的VDMOS可靠性分析 | 期刊论文 | 王亭;徐厚宝;李泠泽;陈贺 |
2 | Reliability analysis of an explosive logic network with multi-state | 会议论文 | Houbao Xu;Mei Li |
3 | Change-point analysis with bathtub shape for the exponential distribution | 期刊论文 | Xia Cai;Khamis Khalid Said;Wei Ning |
4 | 一种网络试验板 | 专利 | 于海江;吴奎先;刘建平;黄荣;黄薇;张政;何玲 |
5 | Modified information approach for detecting change points in piecewise linear failure rate function | 期刊论文 | Xia Cai;Yubin Tian;Wei Ning |
6 | WCF approach of reliability assessment for solid state power controller with accelerate degradation data | 期刊论文 | 蔡霞;田玉斌;徐厚宝;王骏 |
7 | 爆炸药间隙零门可靠性窗口分析 | 期刊论文 | 徐厚宝;周利钦;于海江 |
8 | 爆炸间隙零门试验板 | 专利 | 中国工程物理研究院化工材料研究所 |
9 | Instantaneous Reliability Index of a Typical Repairable System | 期刊论文 | Ruonan Fan;Houbao Xu;田佳艳 |
10 | Reliability analysis for gap null gate by bivariate t-distribution | 会议论文 | Houbao Xu;Mei Li |