基于修饰探针的纳滤膜表面电荷与有机污染物作用机理研究
序号 | 标题 | 类型 | 作者 |
---|---|---|---|
1 | Strain states and evolutionary mechanism of microstructures at the crack tips of monocrystalline silicon | 期刊论文 | Xu Li;Ran Zhang;Shuo Li;Yalei Wang;Lei Cui;Yaxuan Yao;Lingling Ren;Xueshen Wang;Senlin Jin;Yi Zhang;Xingfu Tao |
2 | The resolution and repeatability of stress measurement by Raman and EBSD in silicon | 期刊论文 | Xu Li;Senlin Jin;Ran Zhang;Ying Gao;Zheng Liu;Yaxuan Yao;Yalei Wang;Xueshen Wang;Yi Zhang;X.F. Tao |