氧化物半导体薄膜晶体管的模型及参数提取方法研究

61274085
2012
F0404.半导体电子器件与集成
姚若河
面上项目
教授
华南理工大学
80万元
薄膜晶体管;建模;参数提取;氧化物半导体
2013-01-01到2016-12-31
  • 中英文摘要
  • 结题摘要
  • 结题报告
  • 项目成果
  • 项目参与人
查看更多信息请先登录或注册
查看更多信息请先登录或注册
查看更多信息请先登录或注册
重置
序号 标题 类型 作者
1 A model for threshold voltage shift under negative gate bias stress in amorphous InGaZnO thin film transistors 期刊论文 Xu Piao-Rong|Yao Ruo-He|
2 Improvement in the electrical performance and bias-stress stability of dual-active-layered silicon zinc oxide/zinc oxide thin-film transistor 期刊论文 Liu Yu-Rong|Zhao Gao-Wei|Lai Pai-To|Yao Ruo-He|
3 A New Extraction Method of Trap States in Amorphous InGaZnO Thin-Film Transistors 期刊论文 Qiang L.|Yao RH|
4 一个非晶InGaZnO薄膜晶体管线性区陷阱态的提取方法 期刊论文 徐飘荣|强蕾|姚若河|
5 Modeling of current–voltage characteristics for dual-gate amorphous silicon thin-film transistors considering deep Gaussian density-of-state distribution 期刊论文 Qin Jian|Yao Ruohe|
6 A New Definition of the Threshold Voltage for Amorphous InGaZnO Thin-Film Transistors 期刊论文 Qiang, Lei|Yao, Ruohe|
7 A physics-based scheme for potentials of a-Si: H TFT with symmetric dual gate considering deep Gaussian DOS distribution 期刊论文 Qin, Jian|Yao, R. H.|
8 Positive gate-bias temperature instability of ZnO thin-film transistor 期刊论文 Liu Yu-Rong|Su Jing|Lai Pei-Tao|Yao Ruo-He|
9 A new drain current model for amorphous IGZO thin film transistors 期刊论文 Qiang L.|Yao RH|
10 氧化锌薄膜晶体管的光诱导不稳定性 期刊论文 刘玉荣|李星活|苏晶|姚若河|
11 非对称双栅结构a-Si:H薄膜晶体管沟道电势统一模型 期刊论文 秦剑|姚若河|
12 双栅非晶InGaZnO薄膜晶体管有源层厚度对电学性能的影响 期刊论文 蔡旻熹|姚若河||
13 Pseudo-CMOS with Re-Pull-Down Transistor: A Low Power Inverter Design for Thin-Film Transistor 期刊论文 Lihao ZHONG|Ruohe YAO|
14 Analysis of temperature effect on a-Si:H thin film transistors 期刊论文 Qiang L.|Yao RH|
15 Negative gate-bias instability of ZnO thin-film transistors studied by current-voltage and capacitance-voltage analyses 期刊论文 Liu Yurong|Mo Shufeng|Yao Ruohe|
查看更多信息请先登录或注册