考虑多节点电荷收集的纳米CMOS单粒子瞬态效应研究

61376109
2013
F0406.集成电路器件、制造与封装
陈书明
面上项目
教授
中国人民解放军国防科技大学
80万元
中子辐射;SET建模;SET测量;多节点电荷收集
2014-01-01到2017-12-31
  • 中英文摘要
  • 结题摘要
  • 结题报告
  • 项目成果
  • 项目参与人
查看更多信息请先登录或注册
查看更多信息请先登录或注册
查看更多信息请先登录或注册
重置
序号 标题 类型 作者
1 Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology 期刊论文 Huang Pengcheng;Chen Shuming;Chen Jianjun
2 NMOS transistor location adjustment for N-hit single event transient mitigation in 65 nm CMOS bulk technology 会议论文 Wu Zhenyu;Chen Shuming;Huang Pengcheng
3 A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits 期刊论文 Du Yankang;Chen Shuming;Liu Biwei
4 一种通用型单粒子多瞬态脉冲分布测量方法 专利 陈书明;黄鹏程;郝培培
5 Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure 期刊论文 黄鹏程;陈书明
6 Simulation Study of the Selectively Implanted Deep-N-Well for PMOS SET Mitigation 期刊论文 何益百;陈书明
7 Mitigating the SERs of Large Combinational Circuits by Using Half Guard Band Technique in CMOS Bulk Technology 期刊论文 Liang Bin;Du Yakang;Xu Hui
8 A novel ‘S-like’ inverter chains (SIC) test structure for the separation measurement of P-hit and N-hit charge sharing 会议论文 黄鹏程;陈书明
9 一种抗单粒子翻转的D触发器 专利 黄鹏程;陈书明;郝培培
10 Single-event pulse broadening after narrowing effect in nano-CMOS Logic Circuits 期刊论文 黄鹏程;陈书明
11 一种针对轰击NMOS晶体管无面积开销的单粒子瞬态加固方法 专利 陈书明;吴振宇;梁斌;胡春媚;池雅庆;陈建军;黄鹏程;宋睿强;张健;刘蓉容
12 Mirror image: newfangled cell-level layout technique for single-event transient mitigation 期刊论文 Huang Pengcheng;Chen Shuming;Liang Zhengfa;Chen Jianjun;Hu Chunmei;He Yibai
13 Experimental Characterization of the Dominant Multiple Nodes Charge Collection Mechanism 会议论文 Song Ruiqiang;Chen Shuming;Chi Yaqing;Wu Zhenyu;Liang Bin;Chen Jianjun
14 Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area 期刊论文 Chen Shuming;Du Yankang;Liu Biwei;Qin Junrui
15 A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits 期刊论文 Du Yankang;Chen Shuming;Chen Jianjun
查看更多信息请先登录或注册